Product Description This digital document is an article from Advanced Materials & Processes, published by ASM International on April 1, 1996. The length of the article is 692 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
From the supplier: Secondary ion mass spectrometry (SIMS) is a method used to image the microanalysis of materials. It involves bombarding the surface of the material to be analysed with an energetic ion beam, and the subsequent mass spectrometric analysis of ejected secondary ions to establish their amount and sample origin. SIMS enables researchers to analyse the chemical relationships linked to the creation of complex microstructures in a welded aluminum-lithium alloy.
Citation Details Title: SIMS imaging of Al-Li alloy welds. (Secondary ion mass spectrometry; aluminum;lithium) Author: Kamal K. Soni Publication:Advanced Materials & Processes (Refereed) Date: April 1, 1996 Publisher: ASM International Volume: v149 Issue: n4 Page: p35(2)
